OVE EN IEC 60749-37:2024 01 01
Current
Current
The latest, up-to-date edition.
Semiconductor devices – Mechanical and climatic test methods – Part 37: Board level drop test method using an accelerometer
Available format(s)
Hardcopy
Language(s)
English, German
Published date
01-01-2024
Important note : Users cannot be edited or removed once added to your Multi user PDF.| Committee |
TC 47
|
| DocumentType |
Test Method
|
| Pages |
54
|
| ProductNote |
This standard is also refers to IEC 60749-10, IEC 60749-20
|
| PublisherName |
Osterreichisches Normungsinstitut/Austrian Standards
|
| Status |
Current
|
| Supersedes |
| Standards | Relationship |
| IEC 60749-37:2022 | Identical |
| EN IEC 60749-37:2022 | Identical |
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