PD IEC/TR 62240:2005
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Process management for avionics. Use of semiconductor devices outside manufacturers\' specified temperature range
Hardcopy , PDF
31-05-2013
English
31-01-2006
Important note : Users cannot be edited or removed once added to your Multi user PDF.
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Objectives
5 Using devices outside the manufacturer's
specified temperature ranges
5.1 Device selection, usage and alternatives
5.2 Device capability assessment
5.3 Device quality assurance in wider
temperature ranges
5.4 Documentation
5.5 Device identification
Annex A (informative) Device parameter
re-characterisation
A.1 Glossary of Symbols
A.2 Rationale for parameter
re-characterisation
A.3 Capability assurance
A.4 Quality assurance
A.5 Factors to be considered in parameter
re-characterisation
A.6 References
Annex B (informative) Stress balancing
B.1 General
B.2 Glossary of symbols
B.3 Stress balancing
B.4 Application example
B.5 Other notes
Annex C (informative) Parameter conformance
assessment
C.1 General
C.2 Test plan
Annex D (informative) Higher assembly level testing
D.1 General
D.2 Process
Bibliography
Describes the processes that exist for using semiconductor devices in wider temperature ranges than those specified by the device manufacturer.
| Committee |
GEL/107
|
| DevelopmentNote |
Supersedes BS PD IEC 62240. (02/2006)
|
| DocumentType |
Standard
|
| Pages |
56
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
Reports processes that exist for using semiconductor devices in wider temperature ranges than those specified by the device manufacturer. Covers applications in avionics in which only the performance of the device is an issue. The wider temperature ranges will be limited to those that do not compromise the system performance or application-specific reliability of the device.
| Standards | Relationship |
| IEC TR 62240:2005 | Identical |
| IEC 60134:1961 | Rating systems for electronic tubes and valves and analogous semiconductor devices |
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.