• There are no items in your cart

PD IEC/TR 62572-2:2008

Current

Current

The latest, up-to-date edition.

Fibre optic active components and devices. Reliability standards Laser module degradation

Available format(s)

Hardcopy , PDF

Language(s)

English

Published date

08-09-2008

€243.07
Excluding VAT

INTRODUCTION
1 Scope
2 Normative references
3 Terms and definitions
4 Laser diode and laser module
  failure mechanisms
  4.1 General
  4.2 Description of the main failure
      mechanisms which affect laser
      diodes and laser modules
      4.2.1 Laser diodes
      4.2.2 Monitor photodiode
      4.2.3 TEC and thermistor
      4.2.4 Packaging and optical fibre
5 Guidance on testing
  5.1 Service life tests - General
  5.2 Scale of testing
  5.3 Screening of components (including burn-in)
      5.3.1 Laser diodes
      5.3.2 Monitor photodiode
      5.3.3 Other components of the laser module
6 Guidance on the use of failure
  criteria during testing
7 Guidance on reliability predictions
  7.1 Lifetime predictions
  7.2 Failure rate prediction

Describes reliability assessment of laser modules used for telecommunication guidance on testing, use of failure criteria and reliability predictions is provided.

Committee
GEL/86/3
DocumentType
Standard
Pages
0
PublisherName
British Standards Institution
Status
Current

IEC/TR 62572-2:2008(E) provides guidance on:
- the testing that a system supplier should ensure is in a place prior to procurement of a laser module from a laser module manufacturer;
- a range of activities expected of a system supplier to verify a laser module manufacturer\'s reliability claims.
This technical report deals with reliability assessment of laser modules used for telecommunication guidance on testing, use of failure criteria and reliability predictions is provided.

Standards Relationship
IEC TR 62572-2:2008 Identical

MIL-STD-883 Revision K:2016 TEST METHOD STANDARD - MICROCIRCUITS
IEC 60749-1:2002 Semiconductor devices - Mechanical and climatic test methods - Part 1: General
IEC 60747-1:2006+AMD1:2010 CSV Semiconductor devices - Part 1: General
ISO 9000:2015 Quality management systems — Fundamentals and vocabulary
IEC 60068-2-1:2007 Environmental testing - Part 2-1: Tests - Test A: Cold
IEC 60068-2-14:2009 Environmental testing - Part 2-14: Tests - Test N: Change of temperature

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.