PD IEC/TR 63133:2017
Current
The latest, up-to-date edition.
Semiconductor devices. Scan based ageing level estimation for semiconductor devices
Hardcopy , PDF
English
29-01-2018
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FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and abbreviated terms
4 Ageing level
Bibliography
Defines a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level.
| Committee |
EPL/47
|
| DocumentType |
Standard
|
| Pages |
20
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
This Technical Report specifies a design technique of performance estimation storage element, which can monitor semiconductor ageing and characterize ageing level. The estimated ageing level can be used to improve the reliability of system.
| Standards | Relationship |
| IEC TR 63133:2017 | Identical |
| IEEE 1149.1-2013 REDLINE | IEEE Standard for Test Access Port and Boundary-Scan Architecture |
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