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PD ISO/TS 17915:2013

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

Optics and photonics. Measurement method of semiconductor lasers for sensing

Available format(s)

Hardcopy , PDF

Superseded date

31-05-2018

Superseded by

BS ISO 17915:2018

Language(s)

English

Published date

31-07-2013

€271.12
Excluding VAT

Foreword
1 Scope
2 Normative references
3 Optical sensing using semiconductor lasers
4 Measurement method for temperature dependence of wavelength
5 Measurement method for current dependence of wavelength
6 Measurement method of spectral line width
Annex A (informative) - Essential ratings and characteristics
Bibliography

Specifies methods of measuring temperature, injected current dependence and lasing spectral line width in relation to semiconductor lasers for sensing applications.

Committee
CPW/172
DocumentType
Standard
Pages
36
PublisherName
British Standards Institution
Status
Superseded
SupersededBy

Standards Relationship
ISO/TS 17915:2013 Identical

IEC 62007-1:2015 Semiconductor optoelectronic devices for fibre optic system applications - Part 1: Specification template for essential ratings and characteristics
IEC 60747-5-2:1997+AMD1:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-2: Optoelectronic devices - Essential ratings and characteristics
ISO 13695:2004 Optics and photonics — Lasers and laser-related equipment — Test methods for the spectral characteristics of lasers
IEC 60747-5-1:1997+AMD1:2001+AMD2:2002 CSV Discrete semiconductor devices and integrated circuits - Part 5-1: Optoelectronic devices - General
IEC 60050-521:2002 International Electrotechnical Vocabulary (IEV) - Part 521: Semiconductor devices and integrated circuits
ISO 11145:2016 Optics and photonics Lasers and laser-related equipment Vocabulary and symbols

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