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PN EN 60749-44 : 2017

Current

Current

The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 44: NEUTRON BEAM IRRADIATED SINGLE EVENT EFFECT (SEE) TEST METHOD FOR SEMICONDUCTOR DEVICES

Published date

10-05-2017

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Committee
TC 60
DocumentType
Standard
PublisherName
Polish Committee for Standardization
Status
Current

Standards Relationship
EN 60749-44:2016 Identical
BIS IS/IEC 61558-2-6 : 1ED 2016 Identical
BIS IS/IEC 61558-2-6 : 1ED 2016 Identical

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