PNE-prEN 60749-37
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods -- Part 37: Board level drop test method using an accelerometer
Published date
24-06-2008
Publisher
| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| PublisherName |
Asociacion Espanola de Normalizacion
|
| Status |
Current
|
Sorry this product is not available in your region.
Access your standards online with a subscription
Features
-
Simple online access to standards, technical information and regulations.
-
Critical updates of standards and customisable alerts and notifications.
-
Multi-user online standards collection: secure, flexible and cost effective.