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PREN 15979 : DRAFT 2009

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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TESTING OF CERAMIC RAW AND BASIC MATERIALS - DIRECT DETERMINATION OF MASS FRACTIONS OF IMPURITIES IN POWDERS AND GRANULES OF SILICON CARBIDE BY OES BY DC ARC EXCITATION

Superseded date

01-01-2011

Superseded by

EN 15979:2011

Published date

12-01-2013

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Foreword
1 Scope
2 Principle
3 Fundamentals
4 Apparatus
5 Reagents
6 Sampling and preparation of test samples
7 Calibration
8 Procedure
9 Calculation
10 Expression of results
11 Precision
12 Test report
Annex A (informative) - Results of inter-laboratory study
Annex B (informative) - Wavelength and working range
Annex C (informative) - Possible Interferences and their
        elimination
Annex D (informative) - Information regarding the evaluation
        of the uncertainty of the mean value
Annex E (informative) - Commercial certified reference
        materials
Bibliography

Specifies the method for the analysis of mass fractions of the impurities Al, B, Ca, Cr, Cu, Fe, Mg, Ni, Ti, V and Zr in powder- and grain-shaped silicon carbide of ceramic raw and basic materials.

Committee
TC 187
DocumentType
Draft
PublisherName
Comite Europeen de Normalisation
Status
Superseded
SupersededBy

Standards Relationship
NEN EN 15979 : 2011 Identical
NF EN 15979 : 2011 Identical
09/30187538 DC : 0 Identical

ISO/IEC Guide 98:1993 Guide to the expression of uncertainty in measurement (GUM)
ISO 5022:1979 Shaped refractory products — Sampling and acceptance testing
ISO 5725-4:1994 Accuracy (trueness and precision) of measurement methods and results Part 4: Basic methods for the determination of the trueness of a standard measurement method
ISO 5725-2:1994 Accuracy (trueness and precision) of measurement methods and results Part 2: Basic method for the determination of repeatability and reproducibility of a standard measurement method
ISO 8656-1:1988 Refractory products — Sampling of raw materials and unshaped products — Part 1: Sampling scheme

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