PREN 15991 : DRAFT 2014
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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TESTING OF CERAMIC AND BASIC MATERIALS - DIRECT DETERMINATION OF MASS FRACTIONS OF IMPURITIES IN POWDERS AND GRANULES OF SILICON CARBIDE BY INDUCTIVELY COUPLED PLASMA OPTICAL EMISSION SPECTROMETRY (ICP OES) WITH ELECTROTHERMAL VAPORISATION (ETV)
01-11-2015
12-01-2013
Foreword
1 Scope
2 Principle
3 Spectrometry
4 Apparatus
5 Reagents and auxiliary material
6 Sampling and sample preparation
7 Calibration
8 Procedure
9 Wavelength and working range
10 Calculation of the results and evaluation
11 Reporting of results
12 Precision
13 Test report
Annex A (informative) - Results of interlaboratory study
Annex B (informative) - Wavelength and working range
Annex C (informative) - Possible interferences and their elimination
Annex D (informative) - Information regarding the evaluation of the
uncertainty of the mean value
Annex E (informative) - Commercial certified reference materials
Annex F (informative) - Information regarding the validation of an
analytical method based on liquid standards at the example
of SiC and graphite
Bibliography
Describes a method for the determination of the trace element concentrations of Al, Ca, Cr, Cu, Fe, Mg, Ni, Ti, V and Zr in powdered and granular silicon carbide.
| Committee |
TC 187
|
| DocumentType |
Draft
|
| PublisherName |
Comite Europeen de Normalisation
|
| Status |
Superseded
|
| SupersededBy |
| Standards | Relationship |
| 14/30283939 DC : 0 | Identical |
| 09/30187541 DC : 0 | Identical |
| ISO 5022:1979 | Shaped refractory products — Sampling and acceptance testing |
| EN ISO 21068-1:2008 | Chemical analysis of silicon-carbide-containing raw materials and refractory products - Part 1: General information and sample preparation (ISO 21068-1:2008) |
| ISO 5725-4:1994 | Accuracy (trueness and precision) of measurement methods and results Part 4: Basic methods for the determination of the trueness of a standard measurement method |
| ISO 21068-1:2008 | Chemical analysis of silicon-carbide-containing raw materials and refractory products — Part 1: General information and sample preparation |
| ISO 5725-2:1994 | Accuracy (trueness and precision) of measurement methods and results Part 2: Basic method for the determination of repeatability and reproducibility of a standard measurement method |
| ISO 8656-1:1988 | Refractory products — Sampling of raw materials and unshaped products — Part 1: Sampling scheme |
| ISO/IEC Guide 98-3:2008 | Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995) |
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