Name: SAC GB/T 4937.24:2025 - Semiconductor Devices Mechanical and Climate Testing Methods Part 24: Accelerated Humidity-Free Accelerated Stress Testing
Brand: Standardization Administration of China

Semiconductor Devices Mechanical and Climate Testing Methods Part 24: Accelerated Humidity-Free Accelerated Stress Testing

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Hardcopy

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English

Published date

02-12-2025

Publisher

Standardization Administration of China

€184.83

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DocumentType	Standard
Pages	719
PublisherName	Standardization Administration of China
Status	Current

Standards	Relationship
IEC 60749-24:2004	Identical

€184.83

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SAC GB/T 4937.24:2025

Semiconductor Devices Mechanical and Climate Testing Methods Part 24: Accelerated Humidity-Free Accelerated Stress Testing

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