Name: SAC GB/T 4937.25:2025 - Semiconductor Device Mechanical and Climate Testing Methods Part 25: Temperature Cycling
Brand: Standardization Administration of China

Semiconductor Device Mechanical and Climate Testing Methods Part 25: Temperature Cycling

Available format(s)

Hardcopy

Language(s)

English

Published date

02-12-2025

Publisher

Standardization Administration of China

€232.22

Excluding VAT

Summarise this standard

AI-generated summary

DocumentType	Test Method
Pages	720
PublisherName	Standardization Administration of China
Status	Current

Standards	Relationship
IEC 60749-25:2003	Identical

€232.22

Excluding VAT

Product format

I agree to the DRM document license rules apply against the PDF selection made.

Please confirm that you agree to the document license rules for this document.

I agree to the document license rules .

Please confirm that you agree to the document license rules for this document.

Shopping Cart

SAC GB/T 4937.25:2025

Semiconductor Device Mechanical and Climate Testing Methods Part 25: Temperature Cycling

General Product Information

International Equivalents

Industry

Sub-Industry