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SEMI 3D17 : 2017

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

SPECIFICATION FOR REFERENCE MATERIAL FOR BONDED WAFER STACK VOID METROLOGY

Superseded date

16-11-2023

Published date

09-01-2018

Specifies requisite test structures, including design, manufacturing, and certification procedure for a bonded wafer reference sample composed of two wafers.

DevelopmentNote
Not available for sale from ILI, customer to contact SEMI. (01/2018)
DocumentType
Standard
PublisherName
Semiconductor Equipment & Materials Institute
Status
Superseded
SupersededBy

SEMI M20 : 2015 PRACTICE FOR ESTABLISHING A WAFER COORDINATE SYSTEM
SEMI 3D13 : 2015 GUIDE FOR MEASURING VOIDS IN BONDED WAFER STACKS

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