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SEMI G43 : 1987(R2011)

Current

Current

The latest, up-to-date edition.

TEST METHOD FOR JUNCTION-TO-CASE THERMAL RESISTANCE MEASUREMENTS OF MOLDED PLASTIC PACKAGES

Published date

12-01-2013

Test purpose is to determine the thermal resistance of molded- plastic packages using thermal test chips. Test method only deals with junction-to-case measurements of thermal resistance and limits itself to fluid bath testing environments. For this test, conduction through the leads is minimized, thus providing information on the ability of the plastic package material to dissipate heat. Due to the effects of the variable nature of the fluid-stirring and package-mounting procedures and the thermophysical properties of the heat transfer fluids used, this test method should only be used for comparing the thermal characteristics of plastic packages in the same fluid bath system.

DevelopmentNote
Not available for sale from ILI, customer to contact SEMI. (05/2001)
DocumentType
Standard
PublisherName
Semiconductor Equipment & Materials Institute
Status
Current

SEMI G68 : 1996(R2018) TEST METHOD FOR JUNCTION-TO-CASE THERMAL RESISTANCE MEASUREMENTS IN AIR ENVIRONMENT FOR SEMICONDUCTOR PACKAGES
BS PD ES 59008-4.3 : 2000 DATA REQUIREMENTS FOR SEMICONDUCTOR DIE - PART 4-3: SPECIFIC REQUIREMENTS AND RECOMMENDATIONS - THERMAL

SEMI G32 : 1994(R2011) GUIDELINE FOR UNENCAPSULATED THERMAL TEST CHIP

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