• Shopping Cart
    There are no items in your cart

SEMI G81 : 2007(R2015)

Current

Current

The latest, up-to-date edition.

SPECIFICATION FOR MAP DATA ITEMS

Published date

12-01-2013

Sorry this product is not available in your region.

Specifies the data items that relate to electronic substrate mapping.

DevelopmentNote
Not available for sale from ILI, customer to contact SEMI. (05/2001) Includes SEMI G81.1 (05/2015)
DocumentType
Standard
PublisherName
Semiconductor Equipment & Materials Institute
Status
Current

SEMI G85 : JUL 2003 SPECIFICATION FOR MAP DATA FORMAT
SEMI G84 : 2003 SPECIFICATION FOR STRIP MAP PROTOCOL
SEMI E107 : 2002(R2010) SPECIFICATION OF ELECTRIC FAILURE LINK DATA FORMAT FOR YIELD MANAGEMENT SYSTEM
SEMI E130 : 2017 SPECIFICATION FOR PROBER SPECIFIC EQUIPMENT MODEL FOR 300 MM ENVIRONMENT (PSEM300)
SEMI T13 : 2004(R2010) SPECIFICATION FOR DEVICE TRACKING: CONCEPTS, BEHAVIOR AND SERVICES

SEMI T9 : 2010 SPECIFICATION FOR MARKING OF METAL LEAD-FRAME STRIPS WITH A TWO-DIMENSIONAL DATA MATRIX CODE SYMBOL

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.