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SEMI M8:2012(R2018)

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

Specification for Polished Monocrystalline Silicon Test Wafers

Available format(s)

Hardcopy

Superseded date

16-11-2023

Superseded by

SEMI M8:2012(R2023)

Language(s)

English

Published date

01-07-2018

€152.54
Excluding VAT

This Specification covers dimensional and crystallographic properties of monocrystalline virgin silicon test wafers together with selected electrical and surface defect characteristics.

DocumentType
Standard
Pages
0
PublisherName
Semiconductor Equipment & Materials Institute
Status
Superseded
SupersededBy
Supersedes

SEMI M1 : 2017 SPECIFICATION FOR POLISHED SINGLE CRYSTAL SILICON WAFERS

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