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SEMI PV13 : 2014
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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TEST METHOD FOR CONTACTLESS EXCESS-CHARGE-CARRIER RECOMBINATION LIFETIME MEASUREMENT IN SILICON WAFERS, INGOTS, AND BRICKS USING AN EDDY-CURRENT SENSOR
Superseded date
08-02-2021
Published date
12-01-2013
Specifies methods for measuring the excess-carrier lifetime in silicon wafers, ingots, and bricks with carrier recombination lifetime in the range of 0.1 to 15,000 [mu]s.
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