SEMI PV9 : 2011(R2015)
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Current
The latest, up-to-date edition.
TEST METHOD FOR EXCESS CHARGE CARRIER DECAY IN PV SILICON MATERIALS BY NON-CONTACT MEASUREMENTS OF MICROWAVE REFLECTANCE AFTER A SHORT ILLUMINATION PULSE
Published date
12-01-2013
Includes a procedure for measuring decay time in a variety of types of single crystal and multi-crystalline silicon wafers, bricks and ingots.
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