SN EN 60749-1 : 2003
Current
The latest, up-to-date edition.
SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 1: GENERAL
12-01-2013
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and letter symbols
4 Standard atmospheric conditions
5 Electrical measurements
6 Use of electrically defective devices
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Applies to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.
| DocumentType |
Standard
|
| PublisherName |
Swiss Standards
|
| Status |
Current
|
| Standards | Relationship |
| DIN EN 60749-1:2003-12 | Identical |
| IEC 60749-1:2002 | Identical |
| EN 60749-1:2003 | Identical |
| UNE-EN 60749-1:2004 | Identical |
| BS EN 60749-1:2003 | Identical |
| I.S. EN 60749-1:2003 | Identical |
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