SN EN 60749-32 : 2003

Current

Current The latest, up-to-date edition.

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 32: FLAMMABILITY OF PLASTIC-ENCAPSULATED DEVICES (EXTERNALLY INDUCED)

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Published date: 12-01-2013

Publisher: Swiss Standards

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Foreword INTRODUCTION 1 Scope and object 2 Normative references 3 Test procedure Annex ZA (normative) Normative references to international          publications with their corresponding European          publications

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Applies to semiconductor devices (discrete devices and integrated circuits). It determines whether the device ignites due to external heating.

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Document Type	Standard
ISBN
Pages
Published
Publisher	Swiss Standards
Status	Current

International Equivalents – Equivalent Standard(s) & Relationship - (Show below) - (Hide below)

Equivalent Standard(s)	Relationship
IEC 60749-32:2002+AMD1:2010 CSV	Identical
DIN EN 60749-32:2011-01	Identical
I.S. EN 60749-32:2003	Identical
UNE-EN 60749-32:2004	Identical
EN 60749-32:2003/A1:2010	Identical
NF EN 60749-32 : 2003 AMD 1 2011	Identical
BS EN 60749-32 : 2003	Identical
NBN EN 60749-32 : 2004 AMD 1 2010	Identical

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