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SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 36: ACCELERATION, STEADY STATE
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Published date: 12-01-2013
Publisher: Swiss Standards
Foreword1 Scope 2 Normative references3 Test apparatus4 Procedure5 SummaryAnnex ZA (normative) Normative references to international publications with their corresponding European publications
Provides a test for determining the effects of constant acceleration on cavity-type semiconductor devices.
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