SN EN 61726 : 2000

INTRODUCTION
1 Scope
2 Basic description of the reverberation chamber method
3 Measurement of the screening attenuation of the device
      under test (DUT)
4 Description of the test set-up
      4.1 Reverberation chamber
      4.2 Mode stirrer
      4.3 Antennas
      4.4 Test equipment
      4.5 Device under test (DUT)
      4.6 Linking devices
5 Measurement procedure
      5.1 General
      5.2 Measurement of the DUT
      5.3 Measurement of the insertion loss of the cavity
      5.4 Control of the test set-up
      5.5 Revolution speed of the mode stirrer
      5.6 Test frequencies
      5.7 Voltage standing wave ratio (VSWR)
6 Evaluation of the test results
      6.1 Screening attenuation
      6.2 Relationship between transfer impedance
             parameters and screening attenuation
      6.3 Electromagnetic field surrounding the DUT
Annex A (informative) Design of the reverberation chamber
Annex B (informative) Design of the mode stirrer
Annex C (informative) Example of a calibrator
Annex D (informative) Relationship between transfer impedance
                      and screening attenuation
Bibliography

Defines the measurement of screening attenuation, by the reverberation chamber test method, otherwise known as mode stirred chamber. It is suited to virtually any type of microwave component and with no theoretical upper frequency limit. It is limited only toward low frequencies, due to the size of the test equipment, which is dependent upon frequency and is one of several methods of measuring screen attenuation. Examples of microwave components would be waveguides, phase shifters, multiplexers/diplexers, power dividers/combiners etc.