SN EN 61967-2 : 2005

Foreword
1 Scope
2 Normative references
3 Terms and definitions
4 General
5 Test conditions
   5.1 General
   5.2 Supply voltage
   5.3 Frequency range
6 Test equipment
   6.1 General
   6.2 Shielding
   6.3 RF measuring instrument
   6.4 Preamplifier
   6.5 TEM cell
   6.6 Wideband TEM/GTEM cell
   6.7 50-Ohm termination
   6.8 System gain
7 Test set-up
   7.1 General
   7.2 Test configuration
   7.3 Test PCB
8 Test procedure
   8.1 General
   8.2 Ambient measurement
   8.3 DUT operational check
   8.4 DUT emissions measurement
9 Test report
   9.1 General
   9.2 Measurement conditions
10 IC emissions reference levels
Annex A (informative) Example calibration & set-up
         verification sheet
Annex B (informative) TEM cell and wideband TEM cell
         descriptions
         B.1 TEM cell
         B.2 Wideband GTEM cell
Annex C (informative) Calculation of dipole moment
         from measured data
         C.1 General
         C.2 Dipole moment calculation
Annex D (informative) Specification of emissions data
         D.1 General
         D.2 Specification of emission levels
         D.3 Presentation of results
         D.4 Examples
Annex ZA (normative) Normative references to international
         publications with their corresponding European
         publications
Bibliography

Describes a method for measuring the electromagnetic radiation from an integrated circuit (IC).