SN EN 62132-4 : 2006
Current
The latest, up-to-date edition.
INTEGRATED CIRCUITS - MEASUREMENT OF ELECTROMAGNETIC IMMUNITY 150 KHZ TO 1 GHZ - PART 4: DIRECT RF POWER INJECTION METHOD
12-01-2013
1 Scope
2 Normative references
3 Terms and definitions
4 General
4.1 Measurement basics
4.2 Single pin direct power injection
4.3 Multiple pin direct power injection into
pins of differential mode systems
5 Test conditions
6 Test equipment
6.1 General
6.2 RF power source
6.3 RF power meter and directional coupler
7 Test set-up
7.1 General
7.2 Power injection set-up
7.3 Test circuit board
7.4 Characteristics of the power injection set-up
7.5 Decoupling networks
8 Test procedure
8.1 General
8.2 Specific test procedure
9 Test report
Annex A (informative) Example of a specification of
immunity levels e.g. for
automotive applications
Annex B (informative) Hints for the best installation
of a test set-up with respect
to RF
Annex C (informative) Constant peak test level explanation
Annex ZA (normative) Normative references to international
publications with their corresponding
European publications
Bibliography
Specifies a method to measure the immunity of integrated circuits (IC) in the presence of conducted RF disturbances, e.g. resulting from radiated RF disturbances.
DocumentType |
Standard
|
PublisherName |
Swiss Standards
|
Status |
Current
|
Standards | Relationship |
DIN EN 62132-4:2006-10 | Identical |
EN 62132-4:2006 | Identical |
IEC 62132-4:2006 | Identical |
I.S. EN 62132-4:2006 | Identical |
BS EN 62132-4:2006 | Identical |
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