SN EN ISO 18452 : 2016
Current
Current
The latest, up-to-date edition.
FINE CERAMICS (ADVANCED CERAMICS, ADVANCED TECHNICAL CERAMICS) - DETERMINATION OF THICKNESS OF CERAMIC FILMS BY CONTACT-PROBE PROFILOMETER (ISO 18452:2005)
Available format(s)
Hardcopy
Published date
01-08-2016
Publisher
ISO 18452:2005 specifies a method for the determination of the film thickness of a fine ceramic film and ceramic coatings by a contact-probe profilometer.
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