UNE-EN 60749-14:2004
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods -- Part 14: Robustness of terminations (lead integrity)
Available format(s)
Hardcopy , PDF
Language(s)
Spanish, Castilian, English
Published date
11-06-2004
Publisher
Important note : Users cannot be edited or removed once added to your Multi user PDF.| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| Pages |
16
|
| PublisherName |
Asociacion Espanola de Normalizacion
|
| Status |
Current
|
| Standards | Relationship |
| NF EN 60749-14 : 2004 | Identical |
| IEC 60749-14:2003 | Identical |
| NBN EN 60749-14 : 2004 | Identical |
| I.S. EN 60749-14:2003 | Identical |
| BS EN 60749-14:2003 | Identical |
| EN 60749-14:2003 | Identical |
| DIN EN 60749-14:2004-07 | Identical |
| BS 5626-3.1:1981 | Identical |
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