UNE-EN 60749-35:2006
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods -- Part 35: Acoustic microscopy for plastic encapsulated electronic components (IEC 60749-35:2006) (Endorsed by AENOR in January of 2007.)
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-01-2007
Publisher
| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| Pages |
25
|
| PublisherName |
Asociacion Espanola de Normalizacion
|
| Status |
Current
|
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