UNE-EN 60749-40:2011
Current
Current
The latest, up-to-date edition.
Semiconductor devices - Mechanical and climatic test methods - Part 40: Board level drop test method using a strain gauge (Endorsed by AENOR in November of 2011.)
Available format(s)
Hardcopy , PDF
Language(s)
English
Published date
01-11-2011
Publisher
€58.00
Excluding VAT
| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| Pages |
26
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Current
|
| Standards | Relationship |
| IEC 60749-40:2011 | Identical |
| EN 60749-40:2011 | Identical |
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