UNE-EN 62435-2:2017
Current
The latest, up-to-date edition.
Electronic components - Long-term storage of electronic semiconductor devices - Part 2: Deterioration Mechanisms (Endorsed by Asociación Española de Normalización in June of 2017.)
Hardcopy , PDF
English
01-06-2017
This part of the standard, Part 2 Deterioration Mechanisms, is concerned with the way that components degrade over time depending on the storage conditions applied. This part also includes guidance on test methods that may be used to assess generic Deterioration Mechanisms. Mechanisms which apply to specific component types are detailed in parts 5 to 9 of this standard.
| Committee |
CTN 209/SC 47
|
| DocumentType |
Standard
|
| ISBN |
978-2-8322-3836-3
|
| Pages |
26
|
| ProductNote |
THIS STANDARD ALSO REFERS TO IEC 60068-2-20, IEC 62435-4, IEC 62435-9,JEDEC JEP122,JEDEC J-STD-033
|
| PublisherName |
Asociación Española de Normalización
|
| Status |
Current
|
| Standards | Relationship |
| IEC 62435-2:2017 | Identical |
| EN 62435-2:2017 | Identical |
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