09/30183239 DC : 0
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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BS EN 62572-3 - FIBRE OPTIC ACTIVE COMPONENTS AND DEVICES - RELIABILITY STANDARDS - PART 3: LASER MODULES USED FOR TELECOMMUNICATION
Hardcopy , PDF
31-03-2012
English
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and symbols
3.1 Terms and definitions
3.2 Symbols
4 Laser reliability and quality assurance procedure
4.1 Demonstration of product quality
4.2 Testing responsibilities
4.2.1 Recommendation (applicable to laser
customer/system supplier)
4.2.2 Recommendation applicable to system operator
4.3 Quality improvement programmes (QIPs)
5 Tests
5.1 Structural similarity
5.2 Burn-in and screening (when applicable in the
specification)
6 Activities
6.1 Analysis of reliability results
6.2 Technical visits to LMMs
6.3 Design/process changes
6.4 Deliveries
6.5 Supplier documentation
Annex A (informative) - Guidance on testing in Table 1
and Table 2
A.1 Laser module life tests containing thermoelectric
coolers (for example, Peltier, Test 1.1, Table 1)
A.2 Laser module life tests - Uncooled module (Test 1.2,
Table 1)
A.3 Laser diode life tests on submounts (Test 1.3,
Table 1)
A.4 Monitor photodiode life tests (Test 1.4, Table 1)
A.5 Temperature cycling and thermal shock (Test 3,
Table 1 and Test 2, Table
A.6 Sealing/hermeticity (Test 4, Table 1 and Test 3,
Table 2)
A.7 Shock and vibration (Test 5, Table 1 and Test 4,
Table 2)
A.8 High-temperature storage (Test 6, Table 1 and Test 5,
Table 2)
A.9 Electrostatic discharge sensitivity (ESD) (Test 7,
Table 1 and Test 6, Table 2)
A.10 Residual gas analysis (RGA) (Test 8, Table 1 and Test 7,
Table 2)
BS EN 62572-3
Committee |
GEL/86/3
|
DocumentType |
Draft
|
Pages |
21
|
PublisherName |
British Standards Institution
|
Status |
Superseded
|
SupersededBy |
MIL-STD-883 Revision K:2016 | TEST METHOD STANDARD - MICROCIRCUITS |
IEC 60747-1:2006+AMD1:2010 CSV | Semiconductor devices - Part 1: General |
IEC 60749:1996+AMD1:2000+AMD2:2001 CSV | Semiconductor devices - Mechanical and climatic test methods |
ISO 9000:2015 | Quality management systems — Fundamentals and vocabulary |
IEC 60068-2-1:2007 | Environmental testing - Part 2-1: Tests - Test A: Cold |
IEC TR 62572-2:2008 | Fibre optic active components and devices - Reliability standards - Part 2: Laser module degradation |
IEC 60068-2-14:2009 | Environmental testing - Part 2-14: Tests - Test N: Change of temperature |
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