12/30245653 DC : 0
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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BS ISO 15932 - MICROBEAM ANALYSIS - ANALYTICAL ELECTRON MICROSCOPY - VOCABULARY
Hardcopy , PDF
31-12-2013
English
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Foreword
Introduction
1 Scope
2 Normative references
3 Abbreviations
4 Definitions of terms used in the physical basis
of AEM
5 Definitions of terms used in AEM instrumentation
6 Definitions of terms used in specimen preparation
of AEM
7 Definitions of terms used in AEM image formation
and processing
8 Definitions of terms used in AEM image interpretation
and analysis
9 Definitions of terms used in the measurement and
calibration of AEM image magnification and
resolution
10 Definitions of terms used in electron diffraction in
AEM
Bibliography
Alphabetical index
BS ISO 15932
| Committee |
CII/9
|
| DocumentType |
Draft
|
| Pages |
31
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| ISO 10241:1992 | International terminology standards Preparation and layout |
| ISO 1087-1:2000 | Terminology work Vocabulary Part 1: Theory and application |
| ISO 22493:2014 | Microbeam analysis — Scanning electron microscopy — Vocabulary |
| ISO 23833:2013 | Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary |
| ISO 704:2009 | Terminology work — Principles and methods |
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