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  • ISO 23833:2013

    Current The latest, up-to-date edition.

    Microbeam analysis — Electron probe microanalysis (EPMA) — Vocabulary

    Available format(s):  Hardcopy, PDF, PDF 3 Users, PDF 5 Users, PDF 9 Users

    Language(s):  French, English

    Published date:  05-04-2013

    Publisher:  International Organization for Standardization

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    Abstract - (Show below) - (Hide below)

    ISO 23833:2013 defines terms used in the practices of electron probe microanalysis (EPMA). It covers both general and specific concepts classified according to their hierarchy in a systematic order.

    ISO 23833:2013 is applicable to all standardization documents relevant to the practices of EPMA. In addition, some parts of ISO 23833:2013 are applicable to those documents relevant to the practices of related fields (SEM, AEM, EDX, etc.) for definition of those terms common to them.

    General Product Information - (Show below) - (Hide below)

    Committee ISO/TC 202/SC 1
    Development Note Supersedes ISO/DIS 23833. (04/2013)
    Document Type Standard
    Publisher International Organization for Standardization
    Status Current
    Supersedes

    Standards Referenced By This Book - (Show below) - (Hide below)

    BS ISO 22493:2014 Microbeam analysis. Scanning electron microscopy. Vocabulary
    DIN ISO 16592 E : 2015 MICROBEAM ANALYSIS - ELECTRON PROBE MICROANALYSIS - GUIDELINES FOR DETERMINING THE CARBON CONTENT OF STEELS USING A CALIBRATION CURVE METHOD (ISO 16592:2012)
    ISO/TS 10798:2011 Nanotechnologies — Charaterization of single-wall carbon nanotubes using scanning electron microscopy and energy dispersive X-ray spectrometry analysis
    DIN ISO 15632:2015-11 Microbeam analysis - Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis (ISO 15632:2012)
    DIN ISO 13067 E : 2015 MICROBEAM ANALYSIS - ELECTRON BACKSCATTER DIFFRACTION - MEASUREMENT OF AVERAGE GRAIN SIZE (ISO 13067:2011)
    BS ISO 16592:2012 Microbeam analysis. Electron probe microanalysis. Guidelines for determining the carbon content of steels using a calibration curve method
    NF ISO 13067 : 2012 MICROBEAM ANALYSIS - ELECTRON BACKSCATTER DIFFRACTION - MEASUREMENT OF AVERAGE GRAIN SIZE
    ISO/TS 10797:2012 Nanotechnologies Characterization of single-wall carbon nanotubes using transmission electron microscopy
    BS ISO 11938:2012 Microbeam analysis. Electron probe microanalysis. Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
    11/30199190 DC : 0 BS ISO 15632 - MICROBEAM ANALYSIS - INSTRUMENTAL PERFORMANCE PARAMETERS FOR THE SPECIFICATION AND CHECKING OF ENERGY-DISPERSIVE X-RAY SPECTROMETERS FOR USE IN ELECTRON PROBE MICROANALYSIS
    10/30185165 DC : 0 BS ISO 11938 - MICROBEAM ANALYSIS - ELECTRON PROBE MICROANALYSIS - METHODS OF ELEMENTAL AREA ANALYSIS USING WAVELENGTH-DISPERSIVE SPECTROSCOPY
    04/30122733 DC : DRAFT SEP 2004 BS ISO 22309 - MICROBEAM ANALYSIS - QUANTITATIVE ANALYSIS USING ENERGY DISPERSIVE SPECTROMETRY (EDS)
    BS ISO 13067:2011 Microbeam analysis. Electron backscatter diffraction. Measurement of average grain size
    BS ISO 15632:2012 Microbeam analysis. Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
    DIN ISO 16592:2015-12 MICROBEAM ANALYSIS - ELECTRON PROBE MICROANALYSIS - GUIDELINES FOR DETERMINING THE CARBON CONTENT OF STEELS USING A CALIBRATION CURVE METHOD (ISO 16592:2012)
    ISO 22493:2014 Microbeam analysis Scanning electron microscopy Vocabulary
    DD ISO/TS 10798 : DRAFT JULY 2011 NANOTECHNOLOGIES - CHARACTERIZATION OF SINGLEWALL CARBON NANOTUBES USING SCANNING ELECTRON MICROSCOPY AND ENERGY DISPERSIVE X-RAY SPECTROMETRY ANALYSIS
    BS ISO 15932:2013 Microbeam analysis. Analytical electron microscopy. Vocabulary
    BS ISO 22489:2016 Microbeam analysis. Electron probe microanalysis. Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
    17/30328207 DC : DRAFT SEP 2017 BS ISO 20720 - MICROBEAM ANALYSIS - METHODS OF THE SPECIMEN PREPARATION FOR ANALYSIS OF GENERAL POWDERS USING WDS AND EDS
    04/30103951 DC : DRAFT JUN 2004
    DIN ISO 13067:2015-12 Microbeam analysis - Electron backscatter diffraction - Measurement of average grain size (ISO 13067:2011)
    PD ISO/TS 10797:2012 Nanotechnologies. Characterization of single-wall carbon nanotubes using transmission electron microscopy
    DIN ISO 15632 E : 2015 MICROBEAM ANALYSIS - SELECTED INSTRUMENTAL PERFORMANCE PARAMETERS FOR THE SPECIFICATION AND CHECKING OF ENERGY-DISPERSIVE X-RAY SPECTROMETERS FOR USE IN ELECTRON PROBE MICROANALYSIS (ISO 15632:2012)
    ISO 16592:2012 Microbeam analysis — Electron probe microanalysis — Guidelines for determining the carbon content of steels using a calibration curve method
    ISO 13067:2011 Microbeam analysis Electron backscatter diffraction Measurement of average grain size
    ISO 15932:2013 Microbeam analysis — Analytical electron microscopy — Vocabulary
    ISO 22489:2016 Microbeam analysis — Electron probe microanalysis — Quantitative point analysis for bulk specimens using wavelength dispersive X-ray spectroscopy
    16/30296413 DC : 0 BS ISO 19463 - MICROBEAM ANALYSIS - ELECTRON PROBE MICROANALYSER (EPMA) - GUIDELINES FOR PERFORMING QUALITY ASSURANCE PROCEDURES
    12/30245653 DC : 0 BS ISO 15932 - MICROBEAM ANALYSIS - ANALYTICAL ELECTRON MICROSCOPY - VOCABULARY
    ISO 11938:2012 Microbeam analysis — Electron probe microanalysis — Methods for elemental-mapping analysis using wavelength-dispersive spectroscopy
    ISO 15632:2012 Microbeam analysis Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis

    Standards Referencing This Book - (Show below) - (Hide below)

    ISO 1087-1:2000 Terminology work Vocabulary Part 1: Theory and application
    ISO 18115-1:2013 Surface chemical analysis — Vocabulary — Part 1: General terms and terms used in spectroscopy
    ISO/IEC Guide 99:2007 International vocabulary of metrology Basic and general concepts and associated terms (VIM)
    ISO 18115-2:2013 Surface chemical analysis Vocabulary Part 2: Terms used in scanning-probe microscopy
    ISO 704:2009 Terminology work — Principles and methods
    ISO 15632:2012 Microbeam analysis Selected instrumental performance parameters for the specification and checking of energy-dispersive X-ray spectrometers for use in electron probe microanalysis
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