14/30310474 DC : 0
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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BS EN 62433-4 ED 1.0 - EMC IC MODELLING - PART 4: MODELS OF INTEGRATED CIRCUITS FOR RF IMMUNITY BEHAVIOURAL SIMULATION - CONDUCTED IMMUNITY MODELLING (ICIM-CI)
Hardcopy , PDF
30-11-2016
English
Important note : Users cannot be edited or removed once added to your Multi user PDF.
FOREWORD
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions, abbreviations and conventions
4 Philosophy
5 ICIM-CI model description
6 CIML format
7 Extraction
8 Validation of ICIM-CI hypotheses
9 Model usage
Annex A (Informative) - Preliminary definitions for XML
representation
Annex B (Informative) - DPI example with disturbance load
Annex C (Informative) - Conversions between parameter
types
Annex D (Informative) - Example of ICIM-CI model in CIML
format
Annex E (Informative) - CIML Valid keywords and usage
Annex F (Informative) - PDN impedance measurement methods
using vector network analyzer
Annex G (Informative) - RFIP measurement method description
Annex H (Informative) - Immunity simulation with ICIM model based
on non pass/fail test
BS EN 62433-4 Ed 1.0.
| Committee |
EPL/47
|
| DocumentType |
Draft
|
| Pages |
85
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy |
| IEC 62132-4:2006 | Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method |
| IEC 62433-2:2017 | EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE) |
| IEC 62132-1:2015 | Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions |
| ISO 8879:1986 | Information processing Text and office systems Standard Generalized Markup Language (SGML) |
| CISPR 17:2011 | Methods of measurement of the suppression characteristics of passive EMC filtering devices |
| IEC TS 62433-1:2011 | EMC IC modelling - Part 1: General modelling framework |
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