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BS EN 62433-4:2016

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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EMC IC modelling Models of integrated circuits for RF immunity behavioural simulation. Conducted immunity modelling (ICIM-CI)

Available format(s)

Hardcopy , PDF

Superseded date

07-10-2019

Language(s)

English

Published date

30-11-2016

Committee
EPL/47
DevelopmentNote
Supersedes 14/30310474 DC. (11/2016)
DocumentType
Standard
Pages
112
PublisherName
British Standards Institution
Status
Superseded
SupersededBy
Supersedes

IEC 62433-4:2016 specifies a flow for deriving a macro-model to allow the simulation of the conducted immunity levels of an integrated circuit (IC). This model is commonly called Integrated Circuit Immunity Model - Conducted Immunity, ICIM-CI. It is intended to be used for predicting the levels of immunity to conducted RF disturbances applied on IC pins. In order to evaluate the immunity threshold of an electronic device, this macro-model will be inserted in an electrical circuit simulation tool. This macro-model can be used to model both analogue and digital ICs (input/output, digital core and supply). This macro-model does not take into account the non-linear effects of the IC. The added value of ICIM-CI is that it could also be used for immunity prediction at board and system level through simulations. This part of IEC 62433 has two main parts:
- the electrical description of ICIM-CI macro-model elements;
- a universal data exchange format called CIML based on XML. This format allows ICIM-CI to be encoded in a more useable and generic form for immunity simulation.

Standards Relationship
EN 62433-4:2016 Identical
IEC 62433-4:2016 Identical
EN 61169-24:2009 Identical

EN 62132-4:2006 Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
IEC 62132-4:2006 Integrated circuits - Measurement of electromagnetic immunity 150 kHz to 1 GHz - Part 4: Direct RF power injection method
EN 62132-1:2016 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
IEC 62433-2:2017 EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
EN 62433-2:2017 EMC IC modelling - Part 2: Models of integrated circuits for EMI behavioural simulation - Conducted emissions modelling (ICEM-CE)
IEC 62132-1:2015 Integrated circuits - Measurement of electromagnetic immunity - Part 1: General conditions and definitions
ISO 8879:1986 Information processing Text and office systems Standard Generalized Markup Language (SGML)
ISO/IEC 646:1991 Information technology ISO 7-bit coded character set for information interchange
CISPR 17:2011 Methods of measurement of the suppression characteristics of passive EMC filtering devices
EN 55017 : 2011 METHODS OF MEASUREMENT OF THE SUPPRESSION CHARACTERISTICS OF PASSIVE EMC FILTERING DEVICES (CISPR 17:2011)

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