• There are no items in your cart

15/30291643 DC : 0

NA

NA

Status of Standard is Unknown

BS ISO 18516 - SURFACE CHEMICAL ANALYSIS - DETERMINATION OF LATERAL RESOLUTION AND SHARPNESS IN BEAM BASED METHODS

Available format(s)

Hardcopy , PDF

Language(s)

English

Foreword
Introduction
1 Scope
2 Normative references
3 Terms and definitions
4 Symbols and abbreviated terms
5 Guide on how to use this standard
6 Determination of image sharpness
7 Determination of effective lateral resolution by imaging
  of gratings
8 Reporting results
Annex A (informative) - The relation between sharpness parameters
        and effective lateral resolution
Annex B (informative) - Straight edge method: Systematic
        underestimation of D[12-88] caused by insufficient
        plateau length L[pl]
Annex C (informative) - Straight edge method: Required length
        ranges for L[ESF]
Annex D (informative) - Straight edge method: The
        uncertainty of D[12-88]
Annex E (informative) - Narrow stripe method: Systematic
        overestimation of w[LSF] caused by
        inappropriately large widths w[s] of the imaged stripe
Annex F (informative) - Narrow stripe method: The uncertainty
        of w[LSF]
Annex G (informative) - Imaging of square gratings: Reduction
        of image period for 3-stripe gratings
Annex H (informative) - Imaging of square gratings: Relation
        between signal-to-noise ratio and effective lateral resolution
Annex I (informative) - Imaging of square gratings: Minimum number of
        sampling points per period
Annex J (informative) - Imaging of square gratings: Uncertainty of re
        determined by visual inspection of an image or linescan over
        a series of gratings
Annex K (informative) - Imaging of square gratings: Uncertainty of
        re determined by interpolation - extrapolation
Annex L (informative) - Determination of lateral resolution by imaging
        of square gratings - Practical example for SIMS
Bibliography

BS ISO 18516.

Committee
CII/60
DocumentType
Draft
Pages
58
PublisherName
British Standards Institution
Status
NA

ISO 6196-5:1987 Micrographics — Vocabulary — Part 5: Quality of images, legibility, inspection
ISO 22493:2014 Microbeam analysis Scanning electron microscopy Vocabulary
ISO/TR 19319:2013 Surface chemical analysis Fundamental approaches to determination of lateral resolution and sharpness in beam-based methods
ISO 16242:2011 Surface chemical analysis — Recording and reporting data in Auger electron spectroscopy (AES)
ISO 16243:2011 Surface chemical analysis — Recording and reporting data in X-ray photoelectron spectroscopy (XPS)
ISO/IEC Guide 98-3:2008 Uncertainty of measurement — Part 3: Guide to the expression of uncertainty in measurement (GUM:1995)

View more information
€21.85
Excluding VAT

Access your standards online with a subscription

Features

  • Simple online access to standards, technical information and regulations.

  • Critical updates of standards and customisable alerts and notifications.

  • Multi-user online standards collection: secure, flexible and cost effective.