AS/NZS 60269.4.0:2000

1 - AS/NZS 60269.4.0:2000 LOW-VOLTAGE FUSES - SUPPLEMENTARY REQUIREMENTS FOR FUSE-LINKS FOR THE PROTECTION OF SEMICONDUCTOR DEVIC
4 - PREFACE
6 - CONTENTS
9 - 1 General
9 - 1.1 Scope
9 - 1.2 Object
9 - 1.2.1 The following characteristics of fuses:
10 - 1.2.2 Type tests for verification of the characteristics of fuses.
10 - 1.2.3 The markings on fuses.
10 - 1.2.4 Availability and presentation of technical data (see Appendix B).
10 - 1.3 Normative references
10 - 2 Definitions
10 - 2.2 General terms
10 - 2.2.14 Semiconductor device
10 - 2.2.15 Semiconductor fuse-link
11 - 3 Conditions for operation in service
11 - 3.4 Voltage
11 - 3.4.1 Rated voltage
11 - 3.4.2 Applied voltage in service
11 - 3.5 Current
11 - 3.6 Frequency, power factor and time constant
11 - 3.6.1 Frequency
12 - 3.6.3 Time constant
12 - 3.10 Temperature inside an enclosure
12 - 5. Characteristics of fuses
12 - 5.1 Summary of characteristics
12 - 5.2 Rated voltage
12 - 5.4 Rated frequency
12 - 5.5 Rated power dissipation of the fuse- link
12 - 5.6 Limits of time- current characteristics
12 - 5.6.1 Time-current characteristics, time-current zones
13 - 5.6.2 Conventional times and currents
13 - 5.6.3 Gates
13 - 5.6.4 Overload curves
14 - 5.7 Breaking range and breaking capacity
14 - 5.7.1 Breaking range and utilization category
14 - 5.7.2 Rated breaking capacity
14 - 5.8 Cut-off current and I2t characteristics
14 - 5.8.1 Cut-off current characteristics
15 - 5.8.2 I2t characteristics
15 - 5.9 Arc voltage characteristics
15 - 6 Markings
15 - 6.2 Markings on fuse-links
16 - 7 Standard conditions for construction
16 - 7.3 Temperature rise and power dissipation of the fuse-link
16 - 7.4 Operation
16 - 7.5 Breaking capacity
16 - 7.7 I2t characteristics
16 - 7.14 Arc voltage characteristics
16 - 7.15 Special operating conditions
16 - 8 Tests
16 - 8.1 General
16 - 8.1.4 Arrangement of the fuse-link
17 - 8.1.5 Testing of fuse-links
18 - 8.3 Verification of temperature- rise limits and power dissipation
18 - 8.3.1 Arrangement of the fuse-link
18 - 8.3.3 and 8.3.4.2 Measurement of power dissipation of the fuse-link
19 - 8.3.5 Acceptability of test results
19 - 8.4 Verification of operation
19 - 8.4.1 Arrangement of fuse-link
19 - 8.4.3 Test method and acceptability of test results
20 - 8.5 Verification of the breaking capacity
20 - 8.5.1 Arrangement of the fuse
20 - 8.5.5 Test method
22 - 8.6 Verification of the cut-off current characteristic
22 - 8.6.1 Test method
23 - 8.6.2 Acceptability of test results
24 - 8.7 Verification of the I2t characteristics and overcurrent discrimination
24 - 8.7.1 Test method
24 - 8.7.2 Acceptability of test results
24 - 8.7.3 Verification of compliance for "gG " and "gM" fuse-links
24 - 8.7.4 Verification of overcurrent discrimination
24 - 8.7.5 Verification of arc voltage characteristics and acceptability of test results
28 - APPENDIX A - GUIDE FOR THE CO-ORDINATION OF FUSE-LINKS WITH SEMICONDUCTOR DEVICES
28 - A1. General
28 - A1.1 Scope
28 - A1.2 Object
28 - A2. Definitions
28 - A3. Current-carrying capabilities
28 - A3.1 Rated current
29 - A3.2 Continuous duty current
29 - A3.3 Repetitive duty current
29 - A3.4 Overload current
29 - A3.5 Peak current (cut-off current)
30 - A4. Voltage characteristics
30 - A4.1 Rated voltage
30 - A4.2 Applied voltage in service
30 - A4.3 Arc voltage
30 - A5. Power dissipation characteristics
30 - A5.1 Rated power dissipation
31 - A5.2 Factors influencing power dissipation
31 - A5.3 Mutual influence
31 - A6. Time-current characteristics
31 - A6.1 Pre-arcing characteristic
32 - A6.2 Operating I2t characteristic
33 - A7. Breaking capacity
33 - A8. Commutation
34 - APPENDIX B - SURVEY ON INFORMATION TO BE SUPPLIED BY THE MANUFACTURER IN HIS LITERATURE (CATALOGUE) FOR A FUSE DESIGNED FOR

Applies to fuse-links to be used in equipment containing semi-conductor devices for circuits of nominal voltage up to 1500 volt d.c. and also, in so far as they are applicable, for circuits of higher nominal voltages. This Standard is identical with and has been reproduced from IEC 60269-4:1986, incorporating Amendment 1:1995.

These supplementary requirements apply to fuse-links for application in equipment containing semiconductor devices for circuits of rated voltages up to 1 000 V a.c. or circuits of nominal voltages up to 1 500 V d.c. and also, in so far as they are applicable, for circuits of higher nominal voltages. Notes 1. - Such fuse-links are commonly referred to as "semiconductor fuse-links". 2. - In most cases, a part of the associated equipment serves the purpose of a fuse-base. Owing to the great variety of equipment, no general rules can be given; the suitability of the associated equipment to serve as a fuse-base should be subject to agreement between the manufacturer and the user. However, if separate fuse-bases or fuse-holders are used, they should comply with the appropriate requirements of IEC Publication 60269-1.

First published as AS 2005.40-1989.
Jointly revised and redesignated as AS/NZS 60269.4.0:2000.