ASTM E 1854 : 2013 : REDLINE
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Standard Practice for Ensuring Test Consistency in Neutron-Induced Displacement Damage of Electronic Parts
18-04-2020
English
01-06-2013
CONTAINED IN VOL. 12.02, 2015 Defines requirements to ensure consistency in neutron-induced displacement damage testing of silicon and gallium arsenide electronic piece parts.
Committee |
E 10
|
DocumentType |
Redline
|
Pages |
21
|
PublisherName |
American Society for Testing and Materials
|
Status |
Superseded
|
SupersededBy |
1.1This practice sets forth requirements to ensure consistency in neutron-induced displacement damage testing of silicon and gallium arsenide electronic piece parts. This requires controls on facility, dosimetry, tester, and communications processes that affect the accuracy and reproducibility of these tests. It provides background information on the technical basis for the requirements and additional recommendations on neutron testing.
1.2Methods are presented for ensuring and validating consistency in neutron displacement damage testing of electronic parts such as integrated circuits, transistors, and diodes. The issues identified and the controls set forth in this practice address the characterization and suitability of the radiation environments. They generally apply to reactor sources, accelerator-based neutron sources, such as 14-MeV DT sources, and 252Cf sources. Facility and environment characteristics that introduce complications or problems are identified, and recommendations are offered to recognize, minimize or eliminate these problems. This practice may be used by facility users, test personnel, facility operators, and independent process validators to determine the suitability of a specific environment within a facility and of the testing process as a whole. Electrical measurements are addressed in other standards, such as Guide F980. Additional information on conducting irradiations can be found in Practices E798 and F1190. This practice also may be of use to test sponsors (organizations that establish test specifications or otherwise have a vested interest in the performance of electronics in neutron environments).
1.3Methods for the evaluation and control of undesired contributions to damage are discussed in this practice. References to relevant ASTM standards and technical reports are provided. Processes and methods used to arrive at the appropriate test environments and specification levels for electronics systems are beyond the scope of this practice; however, the process for determining the 1-MeV equivalent displacement specifications from operational environment neutron spectra should employ the methods and parameters described herein. Some important considerations and recommendations are addressed in Appendix X1 (Nonmandatory information).
ASTM E 1855 : 2015 : REDLINE | Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors |
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ASTM E 1855 : 2015 : REDLINE | Standard Test Method for Use of 2N2222A Silicon Bipolar Transistors as Neutron Spectrum Sensors and Displacement Damage Monitors |
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ASTM F 980 : 2016 : REDLINE | Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices |
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ASTM E 721 : 2016 : REDLINE | Standard Guide for Determining Neutron Energy Spectra from Neutron Sensors for Radiation-Hardness Testing of Electronics |
ASTM E 722 : 2014 : REDLINE | Standard Practice for Characterizing Neutron Fluence Spectra in Terms of an Equivalent Monoenergetic Neutron Fluence for Radiation-Hardness Testing of Electronics |
ASTM E 170 : 2017 : REDLINE | Standard Terminology Relating to Radiation Measurements and Dosimetry |
ASTM E 668 : 2013 : REDLINE | Standard Practice for Application of Thermoluminescence-Dosimetry (TLD) Systems for Determining Absorbed Dose in Radiation-Hardness Testing of Electronic Devices |
ASTM E 1249 : 2015 : REDLINE | Standard Practice for Minimizing Dosimetry Errors in Radiation Hardness Testing of Silicon Electronic Devices Using Co-60 Sources |
ASTM E 1250 : 2015 : REDLINE | Standard Test Method for Application of Ionization Chambers to Assess the Low Energy Gamma Component of Cobalt-60 Irradiators Used in Radiation-Hardness Testing of Silicon Electronic Devices |
ASTM E 704 : 2013 : REDLINE | Standard Test Method for Measuring Reaction Rates by Radioactivation of Uranium-238 |
ASTM E 261 : 2016 : REDLINE | Standard Practice for Determining Neutron Fluence, Fluence Rate, and Spectra by Radioactivation Techniques |
ASTM E 393 : 2013 : REDLINE | Standard Test Method for Measuring Reaction Rates by Analysis of Barium-140 From Fission Dosimeters |
ASTM E 666 : 2014 : REDLINE | Standard Practice for Calculating Absorbed Dose From Gamma or X Radiation |
ASTM E 944 : 2013-01 | GUIDE FOR APPLICATION OF NEUTRON SPECTRUM ADJUSTMENT METHODS IN REACTOR SURVEILLANCE |
ASTM E 481 : 2016 : REDLINE | Standard Test Method for Measuring Neutron Fluence Rates by Radioactivation of Cobalt and Silver |
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