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BIS IS/IEC 61558-2-6 : 1ED 2016

NA

NA

Status of Standard is Unknown

SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 44: NEUTRON BEAM IRRADIATED SINGLE EVENT EFFECT (SEE) TEST METHOD FOR SEMICONDUCTOR DEVICES

Published date

09-08-2016

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FOREWORD<br>1 Scope<br>2 Normative references<br>3 Terms and definitions<br>4 Test apparatus<br>5 Procedure neutron irradiated soft error test<br>6 Evaluation<br>7 Summary<br>Annex A (informative) - Additional information for the<br>&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;&nbsp;applicable procurement specification<br>Annex B (informative) - White neutron test apparatus<br>Annex C (informative) - Failure rate calculation<br>Bibliography

Defines a procedure for measuring the single event effects (SEEs) on high density integrated circuit semiconductor devices including data retention capability of semiconductor devices with memory when subjected to atmospheric neutron radiation produced by cosmic rays.

Committee
TC 47
DevelopmentNote
Stability Date: 2020. (07/2016)
DocumentType
Standard
PublisherName
Bureau of Indian Standards
Status
NA
SupersededBy
Supersedes

BS IEC 62396-2:2017 Process management for avionics. Atmospheric radiation effects Guidelines for single event effects testing for avionics systems
17/30352610 DC : 0 BS IEC 62396-2 ED2.0 - PROCESS MANAGEMENT FOR AVIONICS - ATMOSPHERIC RADIATION EFFECTS - PART 2: GUIDELINES FOR SINGLE EVENT EFFECTS TESTING FOR AVIONICS SYSTEMS
IEC 62396-2:2017 Process management for avionics - Atmospheric radiation effects - Part 2: Guidelines for single event effects testing for avionics systems

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