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BS 3934-2(1992) : 1992 AMD 13374

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

View Superseded by

MECHANICAL STANDARDIZATION OF SEMICONDUCTOR DEVICES - SCHEDULE OF INTERNATIONAL DRAWINGS GIVING DIMENSIONS

Superseded date

16-09-2002

Superseded by

BS IEC 60191-2 : 1966

Published date

23-11-2012

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Gives standard drawings of semiconductor devices; this will help manufacturers of devices to extend their range of customers internationally.

Committee
ECL/24
DevelopmentNote
Renumbered and superseded by BS IEC 60191-2. (10/2002) Supersedes BS 3934:ADD5(1983) (07/2004)
DocumentType
Standard
PublisherName
British Standards Institution
Status
Superseded
SupersededBy
Supersedes

Standards Relationship
IEC 60191-2:2012 DB Identical

BS IEC 60747-10:1991 Semiconductor devices Generic specification for discrete devices and integrated circuits
BS EN 120001:1993 Harmonized system of quality assessment for electronic components. Blank detail specification. Light emitting diodes, light emitting diode arrays, light emitting diode displays without internal logic and resistor
BS QC 750106:1993 Specification for harmonized system of quality assessment for electronic components. Semiconductor discrete devices. Blank detail specification. Field-effect transistors for case-rated power amplifier applications
BS 3934-1:1992 Mechanical standardization of semiconductor devices Recommendations for the preparation of drawings of semiconductor devices
BS QC 720100:1991 Harmonized system of quality assessment for electronic components. Semiconductor devices. Sectional specification for optoelectronic devices
BS QC700000(1991) : 1991 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRIC COMPONENTS - GENERIC SPECIFICATION FOR DISCRETE DEVICES AND INTEGRATED CIRCUITS
BS QC 790104:1992 Specification for harmonized system of quality assessment for electronic components. Semiconductor devices. Integrated circuits. Family specification. Complementary MOS digital integrated circuits, series 4000 B and 4000 UB
BS QC 750109:1993 Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Rectifier diodes (including avalanche rectifier diodes), ambient and case-rated, for currents greater than 100 A
BS 3934-6:1992 Mechanical standardization of semiconductor devices Specification for the preparation of outline drawings of surface mounted semiconductor device packages
BS EN 150014:1997 Harmonized system of quality assessment for electronic components. Blank detail specification: Thyristor diodes, transient overvoltage suppressors
BS QC 750113:1994 Specification for harmonized system of quality assessment for electronic components. Blank detail specification: reverse blocking triode thyristors, ambient and case-rated, for currents greater than 100 A

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