Committees responsible
National foreword
Specification
1 Scope
2 General
2.1 Related document
2.2 Recommended values of temperature (preferred
values)
2.3 Recommended values of voltages and currents
(preferred values)
2.4 Terminal identification
3 Quality assessment procedures
3.1 Primary stage of manufacture and subcontracting
3.2 Structurally similar devices
3.2.1 Grouping for electrical and optical
characteristic tests in Groups A and/or B
3.2.2 Grouping for environmental and mechanical tests
in Groups B and/or C
3.2.3 Grouping for endurance tests
3.3 Inspection requirements for qualification
approval
3.4 Quality conformance inspection
3.4.1 Division into groups and sub-groups
3.5 Group D tests
3.6 Screening
3.7 Sampling requirements
4 Test and measurement procedures
4.1 Light emitting diodes, infrared emitting diodes,
general measurements
4.2 Photocouplers
4.3 Laser diodes
4.4 Photodiodes and phototransistors
4.5 Other devices (under consideration)
Appendices
A Structural similarity
B Dimensions
C Directions of applied forces for mechanical tests
Tables
I Group A: Lot by lot
II Group B: Lot by lot
III Group C: Periodic
IV Screening (under consideration)
V Sampling requirements for Group A tests
VI Sampling requirements for Group B and C tests, in
which LTPD shall be used
Figures
1 Orientation of a cylindrical device to direction
of applied force
2 Other type of package