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BS 6329:1982

Withdrawn

Withdrawn

A Withdrawn Standard is one, which is removed from sale, and its unique number can no longer be used. The Standard can be withdrawn and not replaced, or it can be withdrawn and replaced by a Standard with a different number.

Method of expression of the properties of spectrum analyzers

Available format(s)

Hardcopy , PDF

Withdrawn date

20-04-2012

Language(s)

English

Published date

31-12-1982

€231.38
Excluding VAT

National foreword
Cooperating organizations
1. Scope
2. Object
Section One - Definitions
3. General terms
4. Terms related to frequency
5. Terms related to amplitude
6. Terms related to digital storage
Section Two - General test requirements
7. General
8. Statement of limits of errors
9. Performance to be verified and checked
10. Combinations of a mainframe with plug-ins
11. Reference waveforms
12. Conditions for test location
13. Type tests
14. General conditions for test purposes
15. Standard values and ranges of influence quantities
16. Preparation for tests
17. Particular conditions
18. Reference conditions
Section Three - Test procedures
19. Display frequency
20. Frequency span
21. Frequency linearity error
22. Frequency drift
23. Residual f.m. (or incidental f.m.)
24. Impulse bandwidth
25. Dynamic (displayed) resolution
26. Dynamic (displayed) skirt resolution
27. Static (amplifiers) resolution bandwidth
28. Shape factor
29. Deflection coefficient
30. Input signal level sensitivity
31. Equivalent input noise sensitivity
32. Peak-to-valley display flatness
33. Relative display flatness
34. Peak-to-valley frequency response
35. Relative frequency response
36. Display law
36.1 Linear display law
36.2 Square law display law
36.3 Logarithmic display law
37. Harmonic dynamic range
38. Non-harmonic dynamic range
39. Display dynamic range
40. Gain compression
41. Hum sidebands
42. Noise sidebands
43. Residual response
44. Intermodulation rejection
Index of terms

Defines the properties of non-real time spectrum analyzers which perform an analysis of the power distribution of a signal by a sampling process. Specifies the conditions and methods for testing the properties of apparatus.

Committee
PEL/85
DevelopmentNote
Also numbered as IEC 60714 Inactive for the new design. Supersedes 79/32254 DC (03/2005)
DocumentType
Standard
Pages
26
PublisherName
British Standards Institution
Status
Withdrawn

BS 4739-1:1979 Method for expression of the properties of cathode-ray oscilloscopes General

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