• BS 9930-0(1983) : AMD 5955

    Superseded A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

    SPECIFICATION FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT OF ELECTRONIC COMPONENTS - FIXED CAPACITORS FOR USE IN ELECTRONIC COMPONENTS - GENERIC SPECIFICATION

    Available format(s): 

    Superseded date:  23-07-2013

    Language(s): 

    Published date:  23-11-2012

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    National foreword
    Committees responsible
    Section One - Scope
    1. Scope
    Section Two - General
    2. General
    2.1 Related documents
    2.2 Units, symbols and terminology
    2.3 Preferred values
    2.4 Marking
    Section Three - Quality assessment procedures
    3. Quality assessment procedures
    3.1 Qualification Approval/Quality Assessment Systems
    3.2 Primary Stage of Manufacture
    3.3 Structurally Similar Components
    3.4 Qualification Approval Procedures
    3.5 Quality Conformance Inspection
    3.6 Alternative test methods
    3.7 Unchecked parameters
    Section Four - Test and measurement procedures
    4. Test and measurement procedures
    4.1 General
    4.2 Standard atmospheric conditions
    4.3 Drying
    4.4 Visual examination and check of dimensions
    4.5 Insulation resistance
    4.6 Voltage proof
    4.7 Capacitance
    4.8 Tangent of loss angle
    4.9 Leakage current
    4.10 Impedance (under consideration)
    4.11 Inductance (under consideration)
    4.12 Outer foil termination
    4.13 Robustness of terminations
    4.14 Resistance to soldering heat
    4.15 Solderability
    4.16 Rapid change of temperature
    4.17 Vibration
    4.18 Bump
    4.19 Shock
    4.20 Container sealing
    4.21 Climatic sequence
    4.22 Damp heat steady state
    4.23 Endurance
    4.24 Variation of capacitance with temperature
    4.25 Storage
    4.26 Surge
    4.27 Charge and discharge test
    4.28 Pressure relief (for electrolytic capacitors)
    4.29 Characteristics at high and low temperature
    4.30 Thermal stability test
    4.31 Component solvent resistance
    4.32 Solvent resistance of the marking
    Appendix A - Interpretation of sampling plans and
                 procedures as described in IEC Publication
                 410 for use within the IEC Quality
                 Assessment System for Electronic Components
    Appendix B - Rules for the preparation of detail
                 specifications for capacitors and resistors
                 for electronic equipment
    Appendix C - Guide for pulse testing of capacitors

    Abstract - (Show below) - (Hide below)

    Applicable to fixed capacitors for use in electronic equipment. Establishes standard terms, inspection procedures and methods of test for use in sectional and detail specifications for Qualification Approval and for Quality Assessment Systems for electronic components.

    General Product Information - (Show below) - (Hide below)

    Committee ECL/4
    Development Note Superseded and renumbered by BS QC300000(1983) (07/2004)
    Document Type Standard
    Publisher British Standards Institution
    Status Superseded
    Superseded By

    Standards Referenced By This Book - (Show below) - (Hide below)

    BS QC301900(1992) : 1992 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT - SECTIONAL SPECIFICATION FOR FIXED MULTILAYER CERAMIC CHIP CAPACITORS
    BS QC 301700:1992 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT - SECTIONAL SPECIFICATION FOR FIXED POLYCARBONATE FILM DIELECTRIC METAL FOIL D.C. CAPACITORS
    BS QC300100(1991) : 1991 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT - SECTIONAL SPECIFICATION: FIXED POLYETHYLENE-TEREPHTHALATE FILM DIELECTRIC METAL FOIL D.C. CAPACITORS
    BS QC300600(1991) : 1991 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT - SECTIONAL SPECIFICATION FOR FIXED CAPACITORS OF CERAMIC DIELECTRIC, CLASS 1
    BS 9930-02.03(1985) : LATEST BLANK DETAIL SPECIFICATION: FIXED TANTALUM CAPACITORS WITH NON SOLID ELECTROLYTE AND FOIL ELECTRODE. ASSESSMENT LEVEL E
    BS QC300200(1983) : 1983 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT - SECTIONAL SPECIFICATION: FIXED TANTALUM CAPACITORS WITH SOLID OR NON-SOLID ELECTROLYTE
    BS 9930-12.01(1984) : LATEST HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRIC COMPONENTS. FIXED CAPACITORS FOR USE IN ELECTRONIC COMPONENTS - SECTIONAL SPECIFICATION: FIXED METALLIZED POLYPROPYLENE FILM DIELECTRIC D.C. CAPACITORS
    BS QC300400(1983) : 1983 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT - SECTIONAL SPECIFICATION: FIXED METALLIZED POLYETHYLENE TEREPHTHALATE FILM DIELECTRIC D.C. CAPACITORS
    BS 9930-02.02(1985) : LATEST BLANK DETAIL SPECIFICATION: FIXED TANTALUM CAPACITORS WITH NON SOLID ELECTROLYTE AND POROUS ANODE. ASSESSMENT LEVEL E
    BS 9930-02.01(1985) : LATEST BLANK DETAIL SPECIFICATION: FIXED TANTALUM CAPACITORS WITH SOLID ELECTROLYTE AND POROUS ANODE. ASSESSMENT LEVEL E
    BS 9930-03.0(1988) : 1988 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS: FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT - ALUMINIUM ELECTROLYTE CAPACITORS WITH SOLID OR NON-SOLID ELECTROLYTE
    BS QC 300900:1991 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT - SECTIONAL SPECIFICATION - FIXED POLYSTYRENE FILM DIELECTRIC METAL FOIL D.C. CAPACITORS
    BS 9930-02.0(1983) : AMD 5950 SECTIONAL SPECIFICATION: FIXED TANTALUM CAPACITORS WITH SOLID OR NON SOLID ELECTROLYTE
    BS 9930-12.0(1983) : AMD 5952 SPEC FOR HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FIXED CAPS FOR USE IN ELECTRONIC COMPS - SEC SPEC: FIXED METALLIZED POLYPROPYLENE FILM DIELECTRIC D.C. CAPACITORS
    BS 9930-04.01(1984) : LATEST BLANK DETAIL SPECIFICATION: FIXED METALLIZED POLYETHYLENE TEREPHTHALATE FILM DIELECTRIC D.C. CAPACITORS. ASSESSMENT LEVEL E
    BS QC300700(1992) : 1992 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT - SECTIONAL SPECIFICATION FOR FIXED CAPACITORS OF CERAMIC DIELECTRIC, CLASS 2
    BS QC300800(1991) : 1991 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT - SECTIONAL SPECIFICATION FOR FIXED TANTALUM CHIP CAPACITORS
    BS QC301800(1991) : 1991 HARMONIZED SYSTEM OF QUALITY ASSESSMENT FOR ELECTRONIC COMPONENTS - FIXED CAPACITORS FOR USE IN ELECTRONIC EQUIPMENT - SECTIONAL SPECIFICATION FOR FIXED POLYPROPYLENE FILM DIELECTRIC METAL FOIL D.C. CAPACITORS
    BS 9930-04.0(1983) : 1983 SECTION SPECIFICATION: FIXED METALLIZED POLYETHYLENE TEREPHTHALATE FILM DIELECTRIC D.C. CAPACITORS

    Standards Referencing This Book - (Show below) - (Hide below)

    BS 2011-2.1T(1981) : 1981 ENVIRONMENTAL TESTING - TESTS - TEST T - SOLDERING
    BS 2011-2.1A(1977) : AMD 4574 BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - TESTS A. COLD
    BS 2011-2.1B(1977) : 1977 ENVIRONMENTAL TESTING - TESTS - TEST B. DRY HEAT
    BS 2011-2.1DB(1981) : 1981 ENVIRONMENTAL TESTING - TESTS - TEST DB AND GUIDANCE: DAMP HEAT, CYCLIC (12 + 12 HOUR CYCLE)
    BS 2011-2.1N(1985) : 1985 ENVIRONMENTAL TESTING - TESTS - TEST N: CHANGE OF TEMPERATURE
    BS 2011-2.1U(1984) : 1984 ENVIRONMENTAL TESTING - TESTS - TEST U: ROBUSTNESS OF TERMINATION AND INTEGRAL MOUNTING DEVICES
    BS 2011-2.1CA(1977) : 1977 ENVIRONMENTAL TESTING - TESTS - TEST CA - DAMP HEAT, STEADY STATE
    BS 2011-2.1EA(1988) : 1988 AMD 7814 ENVIRONMENTAL TESTING - TEST - TEST EA: SHOCK
    IEC 60384-5:1993 Fixed capacitors for use in electronic equipment - Part 5: Sectional specification: Fixed mica dielectric d.c. capacitors with a rated voltage not exceeding 3000 V - Selection of methods of test and general requirements
    BS 2011-2.1EB(1987) : 1987 AMD 7827 ENVIRONMENTAL TESTING - TEST - TEST EB: BUMP
    BS 2011-2.1FC(1983) : 1983 ENVIRONMENTAL TESTING - TESTS - TEST FC: VIBRATION (SINUSOIDAL)
    BS 2011-2.1M(1984) : 1984 ENVIRONMENTAL TESTING - TESTS - TEST M: LOW AIR PRESSURE
    BS 5698-1(1979) : LATEST GUIDE TO PULSE TECHNIQUES AND APPARATUS - PULSE TERMS AND DEFINITIONS
    BS 2011-2.1Q(1981) : 1981 ENVIRONMENTAL TESTING - TESTS - TEST Q: SEALING
    BS 5698-2(1979) : LATEST GUIDE TO PULSE TECHNIQUES AND APPARATUS - PULSE MEASUREMENT AND ANALYSIS GENERAL CONSIDERATIONS
    BS 2011-1.1(1983) : LATEST BASIC ENVIRONMENTAL TESTING PROCEDURES - GENERAL AND GUIDANCE
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