BS QC 300000:1983
Superseded
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Generic specification
Available format(s)
Hardcopy , PDF
Superseded date
31-03-2010
Language(s)
English
Published date
31-10-1983
Publisher
Specifies terms, definitions, methods of test and inspection requirements in the IECQ System.
Committee |
W/-
|
DevelopmentNote |
Supersedes and renumbers BS 9930-0(1983). (07/2004) Supersedes 79/24918 DC. (08/2005)
|
DocumentType |
Standard
|
Pages |
40
|
PublisherName |
British Standards Institution
|
Status |
Superseded
|
SupersededBy | |
Supersedes |
BS QC 300601:1993 | Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification. Fixed capacitors of ceramic dielectric, class 1. Assessment level E |
BS QC 300901:1992 | Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification. Fixed polystyrene film dielectric metal foil d.c. capacitors. Assessment level E |
BS QC 300202:1985 | Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed tantalum capacitors with non-solid electrolyte and porous anode. Assessment level E |
BS QC 301701:1992 | Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification. Fixed polycarbonate film dielectric metal foil d.c. capacitors. Assessment level E |
BS QC 301201:1984 | Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed metallized polypropylene film dielectric d.c. capacitors. Assessment level E |
BS QC 300101:1993 | Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification. Fixed polyethylene-terephthalate film dielectric metal foil d.c. capacitors. Assessment level E |
BS QC 301301:1990 | Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed metallized polypropylene film dielectric a.c. and pulse capacitors. Assessment level E |
BS QC 300301:1993 | Specification for harmonized system of quality assessment for electronic components. Blank detail specification. Fixed capacitors for use in electronic equipment. Aluminium electrolytic capacitors with non-solid electrolyte. Assessment level E |
BS QC 300203:1985 | Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed tantalum capacitors with non-solid electrolyte and foil electrode. Assessment level E |
BS QC 300500:1989 | Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Sectional specification: fixed metallized polycarbonate film dielectric d.c. capacitors |
BS QC 300401:1984 | Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed metallized polyethylene terephthalate film dielectric d.c. capacitors. Assessment level E |
BS QC 300801:1993 | Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification. Fixed tantalum chip capacitors. Assessment level E |
BS QC 300201:1985 | Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed tantalum capacitors with solid electrolyte and porous anode. Assessment level E |
BS QC 301901:1992 | Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification. Fixed multilayer ceramic chip capacitors. Assessment level E |
BS QC 300501:1990 | Specification for harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification: fixed metallized polycarbonate film dielectric d.c. capacitors. Assessment level E |
BS QC 300701:1993 | Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification. Fixed capacitors of ceramic dielectric, class 2. Assessment level E |
BS QC 301300:1989 | Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Sectional specification: fixed metallized polypropylene film dielectric a.c. and pulse capacitors |
BS QC 301801:1993 | Harmonized system of quality assessment for electronic components. Fixed capacitors for use in electronic equipment. Blank detail specification. Fixed polypropylene film dielectric metal foil d.c. capacitors. Assessment level E |
BS 5692:1979 | Method for measurement of the dimensions of a cylindrical electronic component having two axial terminations |
BS 2011-2.1A:1977 | Environmental testing. Tests Tests A. Cold |
BS 2011-2.1B:1977 | Environmental testing. Tests Tests B. Dry Heat |
BS 2011-2.1Ea:1977 | Environmental testing. Tests Test Ea. Shock |
BS 2011-2.1XA(1981) : 1981 AMD 7553 | ENVIRONMENTAL TESTING - TESTS - TEST XA AND GUIDANCE - IMMERSION IN CLEANING SOLVENTS |
BS 2488:1966 | Schedule of preferred numbers for the resistance of resistors and the capacitance of capacitors for telecommunication equipment |
BS 2011-2.1U(1977) : LATEST | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - ROBUSTNESS OF TERMINATIONS AND INTEGRAL MOUNTING DEVICES |
BS 6001-1:1972 | Sampling procedures for inspection by attributes Specification for sampling plans indexed by acceptable quality level (AQL) for lot-by-lot inspection |
BS 2045:1965 | Preferred numbers |
BS 2011-2.1Ca:1977 | Environmental testing. Tests Test Ca. Damp heat, steady state |
BS 4727(1971) : LATEST | |
IEC 60384-5:1993 | Fixed capacitors for use in electronic equipment - Part 5: Sectional specification: Fixed mica dielectric d.c. capacitors with a rated voltage not exceeding 3000 V - Selection of methods of test and general requirements |
BS 2011-2.1Eb:1977 | Test Eb. BumpEnvironmental testing. Tests |
BS 5555:1981 | Specification for SI units and recommendations for the use of their multiples and of certain other units |
BS 5698-1:1979 | Guide to pulse techniques and apparatus Pulse terms and definitions |
BS 2011-1:1967 | The enviromental testing of electronic components and electronic equipment. General |
BS 5698-2:1979 | Guide to pulse techniques and apparatus Pulse measurement and analysis, general considerations |
BS 2011-2.1M(1977) : LATEST | BASIC ENVIRONMENTAL TESTING PROCEDURES - TESTS - LOW AIR PRESSURE |
BS 2011-2.1T:1981 | Environmental testing. Tests Test T. Soldering |
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