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BS EN 60749-1:2003
Current
The latest, up-to-date edition.
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Semiconductor devices. Mechanical and climatic test methods General
Hardcopy , PDF
English
07-07-2003
INTRODUCTION
1 Scope
2 Normative references
3 Terms, definitions and letter symbols
4 Standard atmospheric conditions
5 Electrical measurements
6 Use of electrically defective devices
Annex ZA (normative) Normative references to international
publications with their corresponding European
publications
Applies to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series.
Committee |
EPL/47
|
DevelopmentNote |
Supersedes 01/203181 DC (07/2003) Supersedes BS EN 60749. (09/2005)
|
DocumentType |
Standard
|
Pages |
12
|
PublisherName |
British Standards Institution
|
Status |
Current
|
Supersedes |
Applicable to semiconductor devices (discrete devices and integrated circuits) and establishes provisions common to all the other parts of the series. The contents of the corrigendum of August 2003 have been included in this copy.
Standards | Relationship |
IEC 60749-1:2002 | Identical |
UNE-EN 60749-1:2004 | Identical |
SN EN 60749-1 : 2003 | Identical |
NBN EN 60749-1 : 2004 | Identical |
NF EN 60749-1 : 2003 | Identical |
I.S. EN 60749-1:2003 | Identical |
EN 60749-1:2003 | Identical |
DIN EN 60749-1:2003-12 | Identical |
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