BS EN 60749-2:2002
Current
The latest, up-to-date edition.
Semiconductor devices. Mechanical and climatic test methods Low air pressure
Hardcopy , PDF
English
24-09-2002
Important note : Users cannot be edited or removed once added to your Multi user PDF.| Committee |
EPL/47
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| DevelopmentNote |
Supersedes 00/203558 DC (10/2002) Supersedes BS EN 60749. (09/2005)
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| DocumentType |
Standard
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| Pages |
10
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| PublisherName |
British Standards Institution
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| Status |
Current
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| Supersedes |
Covers the testing of low air pressure on semiconductor devices. The test is intended primarily to determine the ability of component parts and materials to avoid voltage breakdown failures due to the reduced dielectric strength of air and other insulating materials at reduced pressures is only applicable to devices where the operating voltage exceeds 1 000 V. This test is applicable to all semiconductor devices provided they are in cavity type packages. The test is intended for military and space-related applications only. The contents of the corrigendum of August 2003 have been included in this copy.
| Standards | Relationship |
| DIN EN 60749-2:2003-04 | Identical |
| NF EN 60749-2 : 2002 | Identical |
| UNE-EN 60749-2:2003 | Identical |
| NBN EN 60749-2 : 2003 | Identical |
| I.S. EN 60749-2:2002 | Identical |
| EN 60749-2:2002 | Identical |
| IEC 60749-2:2002 | Identical |
| IEC 60068-2-13:1983 | Basic environmental testing procedures - Part 2-13: Tests - Test M: Low air pressure |
| EN 60068-2-13:1999 | Environmental testing - Part 2: Tests - Test M: Low air pressure |
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