• BS EN 60749-20-1:2009

    Current The latest, up-to-date edition.

    Semiconductor devices. Mechanical and climatic test methods Handling, packing, labelling and shipping of surface-mount devices sensitive to the combined effect of moisture and soldering heat

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    Published date:  31-07-2009

    Publisher:  British Standards Institution

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    Table of Contents - (Show below) - (Hide below)

    FOREWORD
    INTRODUCTION
    1 Scope
    2 Normative references
    3 Terms and definitions
    4 General applicability and reliability considerations
      4.1 Assembly processes
          4.1.1 Mass reflow
          4.1.2 Localized heating
          4.1.3 Socketed components
          4.1.4 Point-to-point soldering
      4.2 Reliability
    5 Dry packing
      5.1 Requirements
      5.2 Drying of SMDs and carrier materials before being
          sealed in MBBs
          5.2.1 Drying requirements - level A2
          5.2.2 Drying requirements - levels B2a to B5a
          5.2.3 Drying requirements - carrier materials
          5.2.4 Drying requirements - other
          5.2.5 Excess time between bake and bag
      5.3 Dry pack
          5.3.1 Description
          5.3.2 Materials
          5.3.3 Labels
          5.3.4 Shelf life
    6 Drying
      6.1 Drying options
      6.2 Post exposure to factory ambient
          6.2.1 Floor life clock
          6.2.2 Any duration exposure
          6.2.3 Short duration exposure
      6.3 General considerations for baking
          6.3.1 High-temperature carriers
          6.3.2 Low-temperature carriers
          6.3.3 Paper and plastic container items
          6.3.4 Bakeout times
          6.3.5 ESD protection
          6.3.6 Reuse of carriers
          6.3.7 Solderability limitations
    7 Use
      7.1 Floor life clock start
      7.2 Incoming bag inspection
          7.2.1 Upon receipt
          7.2.2 Component inspection
      7.3 Floor life
      7.4 Safe storage
          7.4.1 Safe storage categories
          7.4.2 Dry pack
          7.4.3 Dry atmosphere cabinet
      7.5 Reflow
          7.5.1 Reflow categories
          7.5.2 Opened MBB
          7.5.3 Reflow temperature extremes
          7.5.4 Additional thermal profile parameters
          7.5.5 Multiple reflow passes
          7.5.6 Maximum reflow passes
      7.6 Drying indicators
          7.6.1 Drying requirements
          7.6.2 Excess humidity in the dry pack
          7.6.3 Floor life or ambient temperature/humidity exceeded
          7.6.4 Level B6 SMDs
    Annex A (normative) - Symbol and labels for moisture-sensitive
            devices
    Annex B (informative) - Board rework
    Annex C (informative) - Derating due to factory environmental
            conditions
    Bibliography
    Annex ZA (normative) - Normative references to international
             publications with their corresponding European
             publications

    Abstract - (Show below) - (Hide below)

    Pertains to all non-hermetic SMD packages which are subjected to reflow solder processes and which are exposed to the ambient air.

    Scope - (Show below) - (Hide below)

    IEC 60749-20-1:2009 applies to all non-hermetic SMD packages which are subjected to reflow solder processes and which are exposed to the ambient air. The purpose of this document is to provide SMD manufacturers and users with standardized methods for handling, packing, shipping, and use of moisture/reflow sensitive SMDs which have been classified to the levels defined in IEC 60749-20. These methods are provided to avoid damage from moisture absorption and exposure to solder reflow temperatures that can result in yield and reliability degradation. By using these procedures, safe and damage-free reflow can be achieved, with the dry packing process, providing a minimum shelf life capability in sealed dry-bags from the seal date.

    General Product Information - (Show below) - (Hide below)

    Committee EPL/47
    Development Note Supersedes 04/30119207 DC. (07/2009)
    Document Type Standard
    Publisher British Standards Institution
    Status Current
    Supersedes

    Standards Referencing This Book - (Show below) - (Hide below)

    IEC 60749-20:2008 Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
    IEC 60749-37:2008 Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
    IEC 60749-30:2005+AMD1:2011 CSV Semiconductor devices - Mechanical and climatic test methods - Part 30: Preconditioning of non-hermetic surface mount devices prior to reliability testing
    EN 60749-30 : 2005 AMD 1 2011 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 30: PRECONDITIONING OF NON-HERMETIC SURFACE MOUNT DEVICES PRIOR TO RELIABILITY TESTING
    IEC 60749-39:2006 Semiconductor devices - Mechanical and climatic test methods - Part 39: Measurement of moisture diffusivity and water solubility in organic materials used for semiconductor components
    EN 60749-39 : 2006 SEMICONDUCTOR DEVICES - MECHANICAL AND CLIMATIC TEST METHODS - PART 39: MEASUREMENT OF MOISTURE DIFFUSIVITY AND WATER SOLUBILITY IN ORGANIC MATERIALS USED FOR SEMICONDUCTOR COMPONENTS
    IPC J STD 033C-1:2014 HANDLING, PACKING, SHIPPING AND USE OF MOISTURE, REFLOW, AND PROCESS SENSITIVE DEVICES
    EN 60749-37:2008 Semiconductor devices - Mechanical and climatic test methods - Part 37: Board level drop test method using an accelerometer
    EN 60749-20:2009 Semiconductor devices - Mechanical and climatic test methods - Part 20: Resistance of plastic encapsulated SMDs to the combined effect of moisture and soldering heat
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