BS EN 60749-31:2003
Current
The latest, up-to-date edition.
Semiconductor devices. Mechanical and climatic test methods Flammability of plastic-encapsulated devices (internally induced)
Hardcopy , PDF
English
04-07-2003
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Foreword
INTRODUCTION
1 Scope and object
2 Normative references
3 Test procedure
Applies to semiconductor devices (discrete devices and integrated circuits). It determines whether the device ignites due to internal heating caused by excessive overloads.
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes BS EN 60749. (09/2005)
|
| DocumentType |
Standard
|
| Pages |
8
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
Applicable to semiconductor devices (discrete devices and integrated circuits), this test determines whether the device ignites due to internal heating caused by excessive overloads. The contents of the corrigendum of August 2003 have been included in this copy.
| Standards | Relationship |
| EN 60749-31:2003 | Identical |
| SN EN 60749-31 : 2003 | Identical |
| DIN EN 60749-31:2003-12 | Identical |
| I.S. EN 60749-31:2003 | Identical |
| UNE-EN 60749-31:2004 | Identical |
| NBN EN 60749-31 : 2004 | Identical |
| NF EN 60749-31 : 2003 | Identical |
| IEC 60749-31:2002 | Identical |
| IEC 61073-1:2009 | Identical |
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