BS EN 60749-4:2002
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
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Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
Hardcopy , PDF
01-01-2017
English
10-09-2002
| Committee |
EPL/47
|
| DocumentType |
Standard
|
| Pages |
12
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
Provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments. The contents of the corrigendum of August 2003 have been included in this copy.
| Standards | Relationship |
| IEC 60749-4:2002 | Identical |
| UNE-EN 60749-4:2003 | Identical |
| EN 60749-4:2017 | Identical |
| IEC 60749-4:2017 | Identical |
| NF EN 60749-4 : 2002 | Identical |
| I.S. EN 60749-4:2017 | Identical |
| DIN EN 60749-4:2016-06 (Draft) | Identical |
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