BS EN 60749-4:2017
Current
The latest, up-to-date edition.
Semiconductor devices. Mechanical and climatic test methods Damp heat, steady state, highly accelerated stress test (HAST)
Hardcopy , PDF
English
28-11-2017
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FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 HAST test - General remarks
5 Test apparatus
6 Test conditions
7 Procedure
8 Failure criteria
9 Safety
10 Summary
Annex ZA (normative) - Normative references to
international publications with their
corresponding European publications
Describes a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes 00/203564 DC (09/2002) Supersedes BS EN 60749. (09/2005) Supersedes 16/30341341 DC. (12/2017)
|
| DocumentType |
Standard
|
| Pages |
16
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
This part of IEC 60749 provides a highly accelerated temperature and humidity stress test (HAST) for the purpose of evaluating the reliability of non-hermetic packaged semiconductor devices in humid environments.
| Standards | Relationship |
| UNE-EN 60749-4:2003 | Identical |
| NBN EN 60749-4 : 2003 | Identical |
| I.S. EN 60749-4:2017 | Identical |
| IEC 60749-4:2017 | Identical |
| EN 60749-4:2017 | Identical |
| DIN EN 60749-4:2016-06 (Draft) | Identical |
| NF EN 60749-4 : 2002 | Identical |
| IEC 60749-5:2017 | Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test |
| EN 60749-5:2017 | Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test |
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