BS EN 60749-6:2002
Superseded
A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.
View Superseded by
Semiconductor devices. Mechanical and climatic test methods Storage at high temperature
Hardcopy , PDF
English
10-09-2002
01-01-2017
| Committee |
EPL/47
|
| DocumentType |
Standard
|
| Pages |
8
|
| PublisherName |
British Standards Institution
|
| Status |
Superseded
|
| SupersededBy | |
| Supersedes |
Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive. The contents of the corrigendum of August 2003 have been included in this copy.
| Standards | Relationship |
| EN 60749-6:2002 | Identical |
| IEC 60749-6:2002 | Identical |
| I.S. EN 60749-6:2002 | Equivalent |
| UNE-EN 60749-6:2003 | Identical |
| I.S. EN 60749-6:2017 | Identical |
| NF EN 60749-6 : 2002 | Identical |
| IEC 60749-6:2017 | Identical |
| EN 60749-6:2017 | Identical |
| DIN EN 60749-6:2016-09 (Draft) | Identical |
| EN 60749-6:2002 | Equivalent |
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