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BS EN 60749-6:2002

BS EN 60749-6:2002

Superseded

Superseded

A superseded Standard is one, which is fully replaced by another Standard, which is a new edition of the same Standard.

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Semiconductor devices. Mechanical and climatic test methods Storage at high temperature

Available format(s)

Hardcopy , PDF

Superseded date

01-01-2017

Language(s)

English

Published date

10-09-2002

Publisher

British Standards Institution

Committee
EPL/47
DocumentType
Standard
Pages
8
PublisherName
British Standards Institution
Status
Superseded
SupersededBy
Supersedes

Aims at testing and determining the effect on all semiconductor electronic devices of storage at elevated temperature without electrical stress applied. This test is considered non-destructive. The contents of the corrigendum of August 2003 have been included in this copy.

Standards Relationship
EN 60749-6:2002 Identical
IEC 60749-6:2002 Identical
I.S. EN 60749-6:2017 Identical
NF EN 60749-6 : 2002 Identical
IEC 60749-6:2017 Identical
EN 60749-6:2017 Identical
UNE-EN 60749-6:2003 Identical
DIN EN 60749-6:2016-09 (Draft) Identical

View more information
Hardcopy - English
PDF - English

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