BS EN 60749-7:2011
Current
The latest, up-to-date edition.
Semiconductor devices. Mechanical and climatic test methods Internal moisture content measurement and the analysis of other residual gases
Hardcopy , PDF
English
30-09-2011
FOREWORD
1 Scope
2 Normative references
3 Terms and definitions
4 Test apparatus
5 Procedure
6 Failure criteria
7 Implementation
8 Summary
Bibliography
Describes the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device.
| Committee |
EPL/47
|
| DevelopmentNote |
Supersedes 00/203560 DC (09/2002) Supersedes BS EN 60749. (09/2005) Supersedes 09/30208079 DC. (09/2011)
|
| DocumentType |
Standard
|
| Pages |
16
|
| PublisherName |
British Standards Institution
|
| Status |
Current
|
| Supersedes |
This International Standard specifies the testing and measurement of water vapour and other gas content of the atmosphere inside a metal or ceramic hermetically sealed device. The test is used as a measure of the quality of the sealing process and to provide information about the long-term chemical stability of the atmosphere inside the package. It is applicable to semiconductor devices sealed in such a manner but generally only used for high reliability applications such as military or aerospace. This test is destructive.
| Standards | Relationship |
| I.S. EN 60749-7:2011 | Identical |
| NF EN 60749-7 : 2012 | Identical |
| IEC 60749-7:2011 | Identical |
| NBN EN 60749-7 : 2011 | Identical |
| DIN EN 60749-7:2012-02 | Identical |
| EN 60749-7:2011 | Identical |
| IEC TS 62607-8-1:2020 | Identical |
| UNE-EN 60749-7:2003 | Identical |
| IEC 60749-8:2002 | Semiconductor devices - Mechanical and climatic test methods - Part 8: Sealing |
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